Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends.

Li-Ting Lee, Shinzaburo Ito, Hiroaki Benten, Hideo Ohkita, Daisuke Mori

Ambio 2012

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A blend of regioregular poly(3-hexylthiophene) (P3HT) and poly{[N,N'-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5'-(2,2'-bithiophene)} (P(NDI2OD-T2), which has the potential for polymer solar cells application, was prepared for current mode atomic force microscopy (C-AFM) measurements in this study. Phase-separated domains and the local electrical characteristics of P3HT/P(NDI2OD-T2) blends were investigated by the C-AFM.

Citation

Li-Ting Lee, Shinzaburo Ito, Hiroaki Benten, Hideo Ohkita, Daisuke Mori. Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends. Ambio. 2012;41 Suppl 2:135-7