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Resonant inelastic soft x-ray scattering (RIXS) was used to study the electronic structure of solid cysteine films. A RIXS map approach, i.e., plotting the x-ray emission intensity as a function of excitation and emission energy, allows us to separate the contributions of the three chemically non-equivalent carbon atoms in cysteine. In particular, we can identify orbitals localized near the photoexcited atoms, as well as orbitals that are delocalized over the entire molecule.

Citation

F Meyer, L Weinhardt, M Blum, M Bär, R G Wilks, W Yang, C Heske, F Reinert. Non-equivalent carbon atoms in the resonant inelastic soft X-ray scattering map of cysteine. The Journal of chemical physics. 2013 Jan 21;138(3):034306

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PMID: 23343275

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