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In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy.

Citation

Nelson Cardenas, Samarendra Mohanty. Decoupling of geometric thickness and refractive index in quantitative phase microscopy. Optics letters. 2013 Mar 15;38(6):1007-9

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PMID: 23503289

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